CHARACTERIZATION OF SURFACE OF THE (100) FACE OF BORAX CRYSTALS USING ATOMIC FORCE MICROSCOPY (AFM): DISLOCATION SOURCE STRUCTURE AND GROWTH HILLOCKS

Suharso Suharso

Abstract


The surface topology of borax crystals grown at a relative supersaturation of 0.025 and 0.21 has been
investigated using ex situ atomic force microscopy (AFM). It was found that the spiral growth hillocks
generated by dislocations occur on the (100) face of borax crystal.
Keywords: Dislocation, growth hillocks, borax

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